Micro Computed Tomography: Measurement Demonstration

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AR

Mar 05, 2019

Topics covered and concepts were precise, to the point and well explained. Both practical and theoretical aspects were taught which is very rare to receive in an online course.

KA

Apr 07, 2019

It helped me a lot giving brief description of nanocharacterization and nanofabrication processes. It will definitely help me in further study and researches on nanotechnology.

從本節課中
Nano Measurement and Characterization Tools: X-ray and Optical Characterization
In this module, we will see demonstrations of micro-computed tomography, X-ray photoelectron spectroscopy, and optical spectroscopy. You will learn the basic function of the equipment and how samples are prepared and measured.

教學方

  • Nan M. Jokerst

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
  • Carrie Donley

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
  • James Cahoon

    James Cahoon

    Assistant Professor
  • Jacob Jones

    Jacob Jones

    Professor

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