Introduction to RTNN

Loading...
查看授課大綱

審閱

4.8(667 個評分)
  • 5 stars
    538 ratings
  • 4 stars
    117 ratings
  • 3 stars
    9 ratings
  • 2 stars
    2 ratings
  • 1 star
    1 ratings
SQ

Sep 18, 2019

This is a very informative course for scientists and researchers especially working in materials science and engineering. I would gladly recommend this course to my research fellows

AR

Mar 05, 2019

Topics covered and concepts were precise, to the point and well explained. Both practical and theoretical aspects were taught which is very rare to receive in an online course.

從本節課中
Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

教學方

  • Nan M. Jokerst

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
  • Carrie Donley

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
  • James Cahoon

    James Cahoon

    Assistant Professor
  • Jacob Jones

    Jacob Jones

    Professor

探索我們的目錄

免費加入並獲得個性化推薦、更新和優惠。