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4.8(574 個評分)
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AR

Mar 05, 2019

Topics covered and concepts were precise, to the point and well explained. Both practical and theoretical aspects were taught which is very rare to receive in an online course.

GC

Feb 14, 2019

Very informative, the structure of lectures were well-organised and nicely done. Fantastically, I was able to learn and gain so much from this course. Really appreciated :-)

從本節課中
Nano Measurement and Characterization Tools: Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy

教學方

  • Nan M. Jokerst

    Nan M. Jokerst

    J. A. Jones Professor of Electrical and Computer Engineering
  • Carrie Donley

    Carrie Donley

    Director of CHANL (Chapel Hill Analytical and Nanofabrication Laboratory)
  • James Cahoon

    James Cahoon

    Assistant Professor
  • Jacob Jones

    Jacob Jones

    Professor

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