SIMS: Basic Principles and Components

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KR

Apr 08, 2020

I am currently doing research on thin film. This course is going to help me a lot. Thanks a lot to the Professor. He is amazing.

HD

May 26, 2020

This course covers a lot of important topics really well. The analysis part is explained in a great way.

從本節課中
Particle Diagnostics. Secondary Ion Mass Spectrometry (SIMS)
This module deals with methods which utilize heavy particles (protons and other ions) as primary bombarding particles. In SIMS sputtering yield is being analyzed, giving great information on surface composition.

教學方

  • Sadovsky Yaroslav

    Sadovsky Yaroslav

    Assistant

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